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P-17 Stylus Profiler

Product picture of the P-17 Stylus Profiler
Product picture of the P-17 Stylus Profiler
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3D graph showing Sharp Ta to PDMS
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P-17 Stylus Profiler

The P-17 offers step height measurement capability for steps from a few nanometers to one millimeter, for production and R&D environments. The system supports 2D and 3D measurements of step heights, roughness, bow and stress for scans up to 200mm without stitching.

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