P-17 Stylus Profiler

Product picture of the P-17 Stylus Profiler
Product picture of the P-17 Stylus Profiler
3D graph with a rainbow pattern
3D graph showing Sharp Ta to PDMS
Image of a solar cell
3D graph of touch screen bump

P-17 Stylus Profiler

The P-17 offers step height measurement capability for steps from a few nanometers to one millimeter, for production and R&D environments. The system supports 2D and 3D measurements of step heights, roughness, bow and stress for scans up to 200mm without stitching.

KLA-Tencor is now KLA

We've updated our look to match who we are as a company —
innovators and optimists
pushing the bounds of technology every day.

Continue to the site
Visit our Vision Page

Are you sure?

You've selected to view this site translated by Google Translate.
KLA China has the same content with improved translations.

Would you like to visit KLA China instead?


您已选择查看由Google翻译翻译的此网站。
KLA中国的内容与英文网站相同并改进了翻译。

你想访问KLA中国吗?