Defect Inspection Systems

Defect Inspection Systems

Candela® defect inspection systems detect and classify a wide range of critical defects on compound semiconductor substrates (GaN, GaAs, InP, sapphire, SiC, etc.) and hard disk drives, with high sensitivity at production throughputs.

Timeline of Innovation

Since the launch of the Candela Optical Surface Analyzer (OSA) in 1997, our technical experts have continued to introduce key innovations in defect sensitivity and classification for the compound semiconductor and data storage markets. Our inspection technology provides performance improvements with each new product release, including our industry-first, award-winning ability to combine high-speed surface defect detection and photoluminescence metrology on a single platform. Learn more about the rich history of innovation of our Candela defect inspectors.

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Candela 8420

Optical Surface Analyzer (OSA) for tool and process monitoring, through detection and classification of surface defects including particle, stains, scratches and macro epi defects for photonics, LED, communications and other compound semiconductor applications.

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Candela 8720

High sensitivity wafer inspection tool, integrating surface defect detection and photoluminescence metrology for GaN applications in HBLED, MicroLED, VCSELs, LiDAR, IoT, 5G and other high-end compound semiconductor applications.

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Candela 8520

High sensitivity, high throughput wafer inspection tool, with integrated surface scattering and photoluminescence technology for detection and classification of topographic and crystallographic defects on SiC and GaN based power devices.

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Low cost, high throughput inspection tool designed for detection and classification of defects on square or round GaAs, glass and sapphire wafers for solar, PV and display applications.

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Candela 6320 and 6340

Laser based inspection system for hard disk drive (HDD) substrates that measures full disk surface topography, micro-roughness and waviness, and inspects the wafer surface for defects. The automated model, Candela 6340, includes disk cassette-to-cassette handling.

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Candela 7110 and 7140

Laser based inspection system for high sensitivity surface defect inspection of hard disk drive (HDD) substrates and media, featuring multiple optical paths for classification of submicron pits and particles. The automated model, Candela 7140, includes disk cassette-to-cassette handling.

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Looking for wafer defect inspection and review for semiconductor chip manufacturing?

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Upcoming Events

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May 25, 2021 09:00 AM Pacific Time (US and Canada)

Resistance Measurements and Wearable Technology


Jul 13, 2021 10:00 AM Pacific Time (US and Canada)

Deep Trench Measurement with the Zeta 3D Optical Profiler

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Aug 10, 2021 10:00 AM Pacific Time (US and Canada)

So Many Metrology Techniques: Which One to Choose?


Sep 8, 2021 09:00 AM Pacific Time (US and Canada)

Theoretical Introduction to Nano-Scratch Testing and 3D Profilometry


Sep 14, 2021 10:00 AM Pacific Time (US and Canada)

Measurement of Soft Materials using Tencor Stylus Profilers


Oct 19, 2021 10:00 AM Pacific Time (US and Canada)

Through Glass Measurements of Surface Topography


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Spot Size and Lateral Resolution of Sheet Resistance Measurements


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Profilm3D for Multiple Interfaces



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