Defect Inspection Systems
Defect Inspection Systems
Candela® systems detect and classify a wide range of critical defects on compound semiconductor substrates (GaN, GaAs, InP, sapphire, SiC, etc.) and hard disk drives, with high sensitivity at production throughputs.
Timeline of Innovation
Since the launch of the Candela Optical Surface Analyzer (OSA) in 1997, our technical experts have continued to introduce key innovations in defect sensitivity and classification for the compound semiconductor and data storage markets. Our inspection technology provides performance improvements with each new product release, including our industry-first, award-winning ability to combine high-speed surface defect detection and photoluminescence metrology on a single platform. Learn more about the rich history of innovation of our Candela defect inspectors.
Candela 8420
Optical Surface Analyzer (OSA) for tool and process monitoring, through detection and classification of surface defects including particle, stains, scratches and macro epi defects for photonics, LED, communications and other compound semiconductor applications.
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Candela 8720
High sensitivity wafer inspection tool, integrating surface defect detection and photoluminescence metrology for GaN applications in HBLED, MicroLED, VCSELs, LiDAR, IoT, 5G and other high-end compound semiconductor applications.
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Candela 8520
High sensitivity, high throughput wafer inspection tool, with integrated surface scattering and photoluminescence technology for detection and classification of topographic and crystallographic defects on SiC and GaN based power devices.
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ZetaScan
Low cost, high throughput inspection tool designed for detection and classification of defects on square or round GaAs, glass and sapphire wafers for solar, PV and display applications.
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Candela 6320 and 6340
Laser based inspection system for hard disk drive (HDD) substrates that measures full disk surface topography, micro-roughness and waviness, and inspects the wafer surface for defects. The automated model, Candela 6340, includes disk cassette-to-cassette handling.
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Candela 7110 and 7140
Laser based inspection system for high sensitivity surface defect inspection of hard disk drive (HDD) substrates and media, featuring multiple optical paths for classification of submicron pits and particles. The automated model, Candela 7140, includes disk cassette-to-cassette handling.
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View MoreUpcoming Event
Automated step height metrology for production process monitoring
Making automated measurements in a production fab requires more than just the capability to measure the feature of interest. The system must have precise measurement results to be able to control the process 24x7. The system must have good
| Event Date | September 22, 2020 |
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