PWG5™: The Complete Wafer Geometry System for IC Fabs
Dec 8, 2020
3D NAND memory is pervasive in today’s electronics – mobile devices, laptops, data centers, automobiles, and USB drives are just...
Surfscan® SP7XP: Detecting Defects Drives Pristine Processes
Dec 7, 2020
Today, KLA Corporation announced our new Surfscan® SP7XP wafer defect inspection system. This new member of our Surfscan family of...
New Orbotech Solutions Enable Next-Gen Electronics
Nov 30, 2020
As 5G smartphones, advanced automotive electronics, medical and WFH/LFH (learn-from-home) devices become lighter in weight, smaller in form factor and...
Meet KLA Instruments
Nov 16, 2020
Earlier this year we launched KLA Instruments, bringing together many of our product lines in the surface metrology space. We...
New Packaging Products Drive Innovation
Sep 21, 2020
Today, KLA Corporation announced the launch of three new semiconductor packaging systems to drive innovation and improve yield and quality....
A KlearView™ of All Reticle Data
Sep 16, 2020
Complex, high-volume semiconductor manufacturing processes require advanced optical and EUV reticles. These reticles must be error-free, as reticle defects or...
New Defect Inspection System for SiC, GaN Substrates
Aug 27, 2020
Today KLA Instruments announced the Candela® 8520 defect inspection system for power device applications. It is the successor to the ...
Breakthrough e-Beam Defect Inspection System
Jul 20, 2020
Today KLA Corporation (NASDAQ: KLAC) announced the revolutionary eSL10™ e-beam patterned-wafer defect inspection system. The new system is designed to accelerate time-to-market for...
SPTS’s Synapse™ for AlN/AlScN Etch for BAW Filters
Jul 20, 2020
In this article, SPTS, A KLA Company, demonstrates how their Synapse ™ plasma system can provide significant advantages over Inductively...