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Advanced Hard Disk Defect Detection and Classification of Micro-pits, Bumps, and Particles
Candela 7100 Hard Disk Defect Inspection System

Product Description

Continued growth in areal density drives the need for lower surface contamination levels, smoother disk surfaces, increased hard disk inspection sensitivity for smaller hard disk defects, and an increased emphasis on controlling specific defect types early in the process. Moreover, with magnetic recording head fly-heights shrinking, smaller defects now have a much larger yield impact.

The Candela™ 7100 hard disk inspection system delivers advanced defect detection and classification for hard disk drive substrates and media. Built upon the production-proven Candela product line, the Candela 7100 hard disk defect inspection system helps manufacturers detect and classify critical submicron defects such as micro-pits, bumps, particles and buried defects, for maximizing yield and lowering total cost of hard disk inspection. Also, the Candela 7100 hard disk defect inspection system reduces dependency on manual, non-production tools and methods, such as an AFM, SEM, and TEM to investigate defects and identify root cause. Analyses currently being conducted on multiple analytical tools can now be done on a single inspection platform saving time and money.

Application

Disk / Drive Manufacturers
  • Defect inspection and classification for hard disk drive substrates and media, both metal and glass
Defect types
  • Hard disk inspection and classification of sub-micron defects such as micro-pits and particles

For more information on the Candela 7100 hard disk inspection system contact our authorized sales representatives in the United States, Asia or Europe. For inquiries, please contact our Sales, Service, or Applications teams.

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