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Product Description

The P-7 offers industry leading measurement repeatability for reliable surface measurement performance. The surface measurement system has 150 mm scan length standard - the only stylus profiler on the market to offer long scan capability without the need for stitching. The UltraLite® sensor includes dynamic force control, excellent linearity, and the highest vertical resolution making it the best sensor available on a stylus profiler. Finally, the surface measurement system includes point-and-click operation and the productivity package to offer the easiest to use tool on the market with the features required by university, R&D, and production environments.

Application

The P-7 Stylus profiler is capable of addressing a wide range of measurements and applications:

  • Thin film step heights
  • Thick film step heights
  • Photo resist / soft films
  • Etched trench depth
  • Materials characterization for surface roughness and waviness
  • Surface curvature and form
  • 2D stress of thin films
  • Dimensional analysis and surface texture
  • 3D imaging of various surfaces
  • Flatness or curvature
  • Defect review and defect analysis
  • And many more
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