P-6  P-17
  email inquiry  


Product Description

The P-17 offers industry leading measurement repeatability for reliable measurement performance.  The system has 200 mm scan length standard - the only stylus profiler on the market to offer long scan capability without the need for stitching.The UltraLite® sensor includes dynamic force control, excellent linearity, and the highest vertical resolution making it the best sensor available on a stylus profiler.The P-17 includes many features to enhance the user experience such as top and side view optics, and motorized theta/leveling stages. Finally, the system includes point-and-click operation and the productivity package to offer the easiest to use tool on the market with the features required by university, R&D, and production environments.

The P-17 OF (open frame) includes all of the capability of the P-17, but allows the user to load larger samples on the 9.5 by 9.5-inch square stage or 300 mm sample chuck.


CMP dishing, pattern-dependent erosion, surface topography characterization, and oxide planarity for greater device performance and yield loss reduction. Measures height, co-planarity and roughness of bumps for flip chip technology. Performs etch depth monitoring on open geometries with automated analysis and simple process set-ups.

Data Storage
Thin film head wafers and sliders, hard disks, optical and magnetic media. Wafer applications include plating thickness, coil heights, and CMP planarity. Slider applications include pole-tip recession analysis, air bearing cavities, and laser texture bump characterization that includes bump height, width, and depth analysis.

MEMS and Opto-Electronics
MEMS and Opto-Electronics step heights, micro-lens height and curvature, and DWDM etch depths.

Other Applications
Hybrid circuits and ceramic substrates, paper and foil finishes, polished and machined surfaces, coated or painted surfaces, and precision-machined surfaces of any kind.

Related Information