P-17 Stylus Profiler

Product picture of the P-17 Stylus Profiler
Product picture of the P-17 Stylus Profiler
3D graph with a rainbow pattern
3D graph showing Sharp Ta to PDMS
Image of a solar cell
3D graph of touch screen bump

P-17 Stylus Profiler

P-17支持从几纳米到一毫米的台阶高度测量,适用于生产和研发环境。该系统可以对台阶高度、粗糙度、翘曲度和应力进行2D和3D测量,其扫描可达200mm而无需图像拼接。

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