P-7 Stylus Profiler

Product image showing the P-7 Stylus Profiler
Product image showing the P-7 Stylus Profiler
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3D graph showing Sharp Ta to PDMS
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P-7 Stylus Profiler

The P-7 offers step height measurement capability for steps from a few nanometers to one millimeter, for production and R&D environments. The system supports 2D and 3D measurements of step heights, roughness, bow, and stress for scans up to 150mm without stitching.

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