MicroXAM-800 Optical Profiler

MicroXAM-800 product image
MicroXAM-800 product image
3d generated image of backside roughness
3d generated image of metal texture
3d generated image of a micro mirror
3d generated image of tooth wear

MicroXAM-800 Optical Profiler

The MicroXAM-800 is a white light interferometer-based optical profiler that measures nanometer-level features with phase scanning interferometry (PSI), and sub-micron to millimeter features with vertical scanning interferometry (VSI). With simple, flexible recipe setup for single scans or automated measurements on multiple sites, the MicroXAM-800 supports both R&D and production environments.

KLA-Tencor is now KLA

We've updated our look to match who we are as a company —
innovators and optimists
pushing the bounds of technology every day.

Continue to the site
Visit our Vision Page

Are you sure?

You've selected to view this site translated by Google Translate.
KLA China has the same content with improved translations.

Would you like to visit KLA China instead?


您已选择查看由Google翻译翻译的此网站。
KLA中国的内容与英文网站相同并改进了翻译。

你想访问KLA中国吗?