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Alpha-Step D-500 Stylus Profiler

Alpha-Step D-500 Stylus Profiler

The Alpha-Step D-500 stylus profiler is capable of measuring 2D step heights from a few nanometers to 1200µm. It also supports 2D measurements of roughness, bow and stress for R&D and production environments.

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Alpha-Step D-600 Stylus Profiler

Alpha-Step D-600 Stylus Profiler

The Alpha-Step D-600 stylus profiler is capable of measuring 2D and 3D step heights from a few nanometers to 1200µm. It also supports 2D and 3D measurements of roughness, plus 2D bow and stress for R&D and production environments.

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P-7 Stylus Profiler

P-7 Stylus Profiler

The P-7 builds on the success of the market leading P-17 benchtop stylus profiling system. It includes the superior measurement performance of the P-17 technology in a platform that offers a great price-to-features ratio for a benchtop stylus profiler. The P-7 offers step height measurement capability for steps from a few nanometers to one millimeter, for production and R&D environments.

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P-17 Stylus Profiler

P-17 Stylus Profiler

The P-17 is an industry leading benchtop stylus profiler, built on over 40 years of surface metrology experience. The P-17 is capable of measuring step height from a few nanometers to one millimeter, for production and R&D environments.

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P-170 Stylus Profiler

P-170 Stylus Profiler

The P-170 is a cassette-to-cassette stylus profiler combining the P-17's industry leading benchtop system measurement performance with the HRP®-260's production proven handler. This combination offers a great price-to-performance ratio for a handler-based system serving the semiconductor, compound semiconductor and related industries.

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HRP®-260

HRP®-260

The HRP®-260 is a high-resolution, cassette-to-cassette stylus profiler. The HRP offers production proven performance with automated wafer handling capability serving the semiconductor, compound semiconductor, high brightness LED, data storage and related industries.

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MicroXAM-800

MicroXAM-800

The MicroXAM-800 optical profiler is a non-contact, 3D surface topography measurement system. The MicroXAM’s white light interferometer supports phase and vertical scanning interferometry to measure features from nanometers to millimeters.

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Zeta-20

Zeta-20

The Zeta-20 benchtop optical profiler is a non-contact, 3D surface topography measurement system. The system is powered by patented ZDot technology and Multi-Mode optics, enabling measurement of a variety of samples: transparent and opaque, low to high reflectance, smooth to rough texture, and step heights from nanometers to millimeters.

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Zeta-300

Zeta-300

The Zeta-300 optical profiler is a non-contact, 3D surface topography measurement system. The system incorporates integrated isolation options and configuration flexibility to handle larger samples. The Zeta-300 is powered by patented ZDot technology and Multi-Mode optics, enabling measurement of a variety of samples: transparent and opaque, low to high reflectance, smooth to rough texture, and step heights from nanometers to millimeters.

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Zeta-388

Zeta-388

The Zeta-388 optical profiler is a non-contact, 3D surface topography measurement system. The system incorporates integrated isolation options and includes a cassette-to-cassette handler for fully automated measurements. The Zeta-388 is powered by patented ZDot technology and Multi-Mode optics, enabling measurement of a variety of samples: transparent and opaque, low to high reflectance, smooth to rough texture, and step heights from nanometer to millimeters.

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