We Invite you to attend the presentation of KLA’s Jijen Vazhaeparambil titled, “Inspection and Metrology Challenges of Materials for Sub10nm Design Rule”, Session 6: Innovations in Metrology, Thursday, October 1, 2:00pm – 2:30pm at the SEMI Virtual Strategic Materials Conference-SMC 2020.

The Strategic Materials Conference is the premier conference devoted to technology and business drivers of materials in the microelectronics industry.