KLA-Tencor’s wafer defect review systems capture high resolution images of the defects detected by defect inspection tools. These images enable defect classification, helping chipmakers to identify and resolve yield issues. Our complete line of defect review and classification tools spans optical and electron-beam technologies, from bench-top research systems to production-worthy tools having full factory automation. KLA-Tencor’s suite of SEM wafer defect inspectors, defect review and classification tools and data management systems form a complete solution for finding, identifying and tracking yield-critical defects and process issues..