• Process Control at the Source

    Five new systems support patterning control
    for advanced IC manufacturing

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    Process Control at the Source: Five new systems support patterning control for advanced IC manufacturing
  • Introducing
    the FlashScan 2XX Series

    Mask Blank Inspection for Optical and EUV

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    Advanced Reticle Inspection Technologies: New Systems Enabling IC Industry's Most Complex Masks
  • Introducing New Metrology Systems for Leading-Edge IC Device Technologies

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    Advanced Reticle Inspection Technologies: New Systems Enabling IC Industry's Most Complex Masks
  • Advanced Reticle Inspection Technologies

    New Systems Enabling IC Industry's Most Complex Masks

    Learn More
    Advanced Reticle Inspection Technologies: New Systems Enabling IC Industry's Most Complex Masks

KLA-Tencor has been a leader in process control for the semiconductor and related industries for 40 years, developing and manufacturing inspection, metrology and data analysis systems that rely on innovative optics, sensors and high performance computing technologies.

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"We foster sustainability and social responsibility through our people, technologies and on-going commitment to our global and local communities."

SpectraShape 9000
Rick Wallace CEO, KLA-Tencor
Company