Automated defect analysis for LED yield enhancement and rapid time to results
Based on the industry-leading KLARITY Defect product for integrated circuit manufacturing, the new KLARITY LED provides a high performance solution for LED device makers, including automated in-line scan analysis for the entire fabwide manufacturing process. With KLARITY LED, device makers have an advanced in-line alternative solution for automated defect analysis of LED production processes, and an option to more efficiently share performance and reliability data within their organization for faster yield learning, while replacing existing labor-intensive manual report generation methods. KLARITY LED delivers faster excursion detection and root-cause analysis than prevailing industry methods to enable effective decision making, thus helping reduce the impact of materials risk and improve yields.
Designed to help LED device makers accelerate yield learning cycles and prompt immediate corrective action, KLARITY LED includes:
KLARITY LED complements KLA-Tencor's wafer inspection systems to provide an enhanced LED-specific portfolio solution for high return on critical LED inspection investments