| Candela™ 6300 Series |
Substrate Metrology and Defect Inspection Systems
Product Description The Candela 6300 series delivers best-in-class substrate metrology and inspection capabilities for data storage substrates and finished media. The Candela 6300 substrate inspection and metrology solution leverages the industry's widest spatial bandwidth coverage (from 0.22 microns to 2,000 microns) and a noise floor below 0.5 angstroms to satisfy emerging requirements for comprehensive roughness and micro-waviness measurements. The Candela 6300 substrate inspection and metrology solution also harnesses patented multi-channel optics, combined with unique laser stability management technology, to deliver powerful measurement capabilities for edge roll-off and texture/polish uniformity, as well as scratch and particle inspection. The Candela 6300 substrate inspection and metrology solution is a manual system suited for laboratory and low volume production, and the Candela 6320 substrate inspection and metrology solution is an automated fully automated cassette-to-cassette system for production environments. Application Roughness and waviness analysis, defect inspection, scratch and ridge inspection, texture uniformity analysis, particle and stain inspection For more information on the Candela 6300 substrate inspection and metrology solution contact our authorized sales representatives in the United States, Asia or Europe. For inquiries, please contact our Sales, Service, or Applications teams.
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