The P-16+ stylus profiler is a surface metrology analysis solution used in a wide range of applications and industries, from R&D departments and universities to production and process monitoring. The surface metrology solution's precise force control provides excellent vertical resolution, precision, and reliability measurements. This stylus profiler delivers automated step height analysis, surface contour, waviness and roughness measurements with detailed 2D or 3D analysis of topography for a variety of surfaces and materials.
CMP monitoring and bump metrology
- Material Science
Thin film thickness, roughness and stress analysis
- Data Storage
Thin film head structure definition and disk edge roll-off
Microlens and diffuser shape
Etch rates and trench depth analysis