Surface Profilometry and Surface Metrology
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The KLA-Tencor series of benchtop stylus and optical surface profilometers offer the most complete range of stylus measurement features to meet the needs of the engineering and research communities. These research-grade stylus surface profilometer products merge surface metrology capability and value with the surface finish measurement tool performance expected from KLA-Tencor’s surface profilometer and surface metrology products.
 
A range of industries, including general scientific and materials research, optoelectronics, and data storage, require stylus surface profilometry and metrology - gauging the measurements of surface topography to either control their processes or research new material characteristics. Typical surface profilometer measurement parameters which we address include surface finish, surface flatness, surface roughness, curvature, peak-to-valley, asperity, waviness, texture, volume, sphericity, slope, density, stress, bearing ratio, and distance mainly in the micron to nanometer range.
 
Stylus Surface Profilometers
P-Series Stylus Profilers
  • P-17: Offers industry leading surface finish measurement repeatability for reliable surface measurement performance.
  • P- 7: Offers industry leading surface finish measurement repeatability for reliable surface measurement performance.
Optical Profilometers
 
CONTACT US:   1.408.875.0692    email inquiry
 


 
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