|
Surface Profilometry and Metrology |
| |
| The KLA-Tencor series of benchtop stylus and optical profilometers offer the most complete range of stylus measurement features to meet the needs of the engineering and research communities. These research-grade surface profilometer products merge surface measuring capability and value with the tool performance expected from KLA-Tencor’s surface metrology products. |
| |
| A range of industries, including general scientific and materials research, optoelectronics, and data storage, require surface profilometry and metrology - gauging the measurements of surface topography to either control their processes or research new material characteristics. Typical surface measurement parameters which we address include surface flatness, surface roughness, curvature, peak-to-valley, asperity, waviness, texture, volume, sphericity, slope, density, stress, bearing ratio, and distance mainly in the micron to nanometer range. |
| |
Stylus Profilometers
P-Series Stylus Profilers
- P-17: Offers industry leading measurement repeatability for reliable measurement performance.
- P- 7: Offers industry leading measurement repeatability for reliable measurement performance.
Optical Profilometers
|
