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 Alpha-Step IQ Surface Profiler
The Alpha-Step IQ stylus-based surface profiler combines high measurement precision with versatility and economy. Ideal for semiconductor pilot lines and materials research, this advanced surface profiler enables faster process learning and higher yields. With guaranteed 8Ã… (1 sigma) or 0.1% step height repeatability and sub-angstrom resolution, the Alpha-Step IQ surface profiler provides excellent repeatability and performance to analyze and monitor processes.
- Provides advanced and customizable 2D surface analysis capabilities
- Enables easy location of measurement features via saved site image with recipe.
- Features excellent repeatability and reproducibility.
- Precisely determines and analyzes thin step heights, surface microroughness, and overall form error on thin film coatings.
- Provides sufficient vertical range for large topography variations.
- Includes multiple language support for users with a worldwide presence.
- Enables faster analysis routines by applying saved sets of analysis instructions.
Comprehensive Surface Metrology Solutions
TheP-16 and P-16OF (3D benchtop surface profiling), Alpha-Step IQ (2D benchtop surface profiling), HRP 350 series (high resolution surface profiling) provide comprehensive surface metrology analysis and surface topography control solutions to meet the needs of the most demanding profiling applications.
Contact our authorized sales representatives in the United States, Asia or Europe and the Middle East, call (831)429-4200 or send an e-mail inquiry to our support team.
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