| WaferCheck 7200 |
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Multi-function, dimensional measurements and sorting
The WaferCheck 7200 system provides the semiconductor industry with a flexible means of automatically characterizing, inspecting and sorting silicon wafers. Wafers from 100mm to 200mm in diameter can be easily measured with up to 40 sort classes. This allows additional capacity for current wafer sizes, and expansion capability for future demands. Modular Configuration Thickness and flatness sorters offer measurement and sorting capability in the intermediate stages of silicon wafer production. For polished wafer inspection and incoming quality control, the 7200E system allows state-of-the-art measurements. Thickness, flatness, bow and warp are measured with 10 nanometer resolution. All systems feature optional resistivity and type measurements. System configuration is modular with up to six senders and twenty-four receivers.
The WaferCheck 7200 systems offer silicon wafer producers the wafer characterization and sorting capabilities needed for advanced production and inspection processes. Related Information
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