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Optical Surface Profiler
The MicroXAM represents a series of optical surface profilers that support a wide range of surface topography applications. Applications served are diverse, including measurement of step heights for complex MEMS structures, quantification of surface texture of biomedical devices, and control of laser texture bump profiles on hard drive disk media. Optical interferometry offers a unique capability to capture 3D surface maps, yet also measuring film thickness of transparent materials. Complex algorithms have been optimized to handle these material dependencies to offer the most accurate measurements. Furthermore, the powerful yet simple to use MapVUEâ„¢ analysis software package offers the user an endless number of parameter calculations, filtering options, and imaging analysis to meet the most stringent R&D needs. The flexibility of the instrument is further demonstrated with its mix of optical objectives and sample stages available to meet the need of each application. As process development begins to mature, the MicroXAM readily adapts to production environments where "hands free" process control is critical. The easy-to-use interface offers simple recipe development, automated sequencing, and simple yet powerful analysis tools. The MicroXAM series of optical profilers offers the widest range of capability, supporting the broadest applications in surface measurement -- with quick measurement speeds at high precision and accuracy. Applications Fiber-optics connector end-face Paper bank note Silicon fiber-optic device substrate Arterial stent device Contact our authorized sales representatives in the United States, Asia or Europe and the Middle East , or send an
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