| Candela CS10 |
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Optical X-BeamTM Surface Analyzer
Product Description
The Candela CS10 Optical Surface Analyzer offers a new approach to unpatterned wafer inspection. By combining two laser paths and four independent detection techniques, the CS10 offers exceptional sensitivity to particles and scratches on optoelectronics and semiconductor wafers. Using a fast spiral scan motion, the CS10 simultaneously measures phase shift, scattered light, reflected light, and topography. The data is represented as high resolution image maps to facilitate visual inspection, or automatically analyzed to detect and classify defects. The compact CS10 platform is well-suited for both laboratory and low volume production applications. Easy to learn and operate, it's the ideal wafer inspection system for failure analysis and process development applications. Contact our authorized sales representatives in the United States, Asia or Europe. For inquiries, please contact our This e-mail address is being protected from spambots. You need JavaScript enabled to view it , This e-mail address is being protected from spambots. You need JavaScript enabled to view it , or This e-mail address is being protected from spambots. You need JavaScript enabled to view it teams. Related Information
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