Product Description

Klarity Bitmap is an automated bitmap analysis solution that collects multi-format bitmap data from testers on the die test floor, classifies failure patterns and views the bitmap failures. Flexible and easy to use, Klarity Bitmap separates killer from nuisance defects and enhances root-cause analysis and yield learning on memory arrays.

• Enables automated yield-excursion monitoring and frees personnel of complex, time-consuming analysis
• Speeds time to results through automated, flexible classification of bit-failure patterns and their correlation with failure mechanisms
• Delivers feedback on yield-killers and their die locations
• Enables fast, color-coded viewing of failed bits and provides viewing of failed-bit patterns to help solve design errors
• Allows users to quickly and intuitively organize, summarize and share large volumes of bitmap data
• Provides automated trending and bit-to-defect analysis through integration with Klarity ACE XP and Klarity Defect

Application

Klarity Bitmap with Klarity Defect, Klarity SSA, and Klarity ACE XP form a fab-wide yield acceleration solution that automatically reduces defect inspection, classification and review data to relevant root-cause and yield-analysis information. Using this information, manufacturers can take corrective action sooner, resulting in faster yield improvements and better time to market.

• Klarity Bitmap Product Overview