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A range of industries, including general scientific and materials research, optoelectronics, and data storage, require measurements of surface topography to either control their processes or research new material characteristics. Typical measurement parameters which we address include flatness, roughness, curvature, peak-to-valley, asperity, waviness, texture, volume, sphericity, slope, density, stress, bearing ratio, and distance mainly in the micron to nanometer range.
Surface Metrology
Stylus Profiling
- Alpha-Step D-Series –Topography of surfaces with outstanding
performance and value
- Alpha-Step IQ: Benchtop stylus profiler for research applications
or pilot lines
- P-Series: Benchtop stylus profilers for production applications
Optical Profiling
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