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General Purpose, Labs

General Purpose, Labs
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A range of industries, including general scientific and materials research, optoelectronics, and data storage, require measurements of surface topography to either control their processes or research new material characteristics. Typical measurement parameters which we address include flatness, roughness, curvature, peak-to-valley, asperity, waviness, texture, volume, sphericity, slope, density, stress, bearing ratio, and distance mainly in the micron to nanometer range.
 
CONTACT US:   1.877.429.4200    email inquiry
 

Surface Metrology

  Stylus Profiling    
Alpha-Step D-Series

Alpha-Step D-Series
Formerly Ambios XP-100 Plus
and XP-200 Plus

Topography of surfaces
with outstanding
performance and value

Contact Ambios Support
Alpha-Step IQ

Alpha-Step IQ
Benchtop stylus profiler
for research applications
or pilot lines
P-Series

P-Series
Benchtop stylus profilers
for production applications
     
Optical Profiling    
Alpha-Step D-Series

MicroXAM - 100
Formerly Ambios Xi-100 Plus
3D topography analysis
of a variety of surfaces
Contact Ambios Support