Bitmap Analysis for Yield Enhancement
Klarity Bitmap is an automated bitmap analysis and yield enhancement solution that collects multi-format bitmap analysis data from testers on the die test floor, classifies failure patterns and views the bitmap failures. Flexible and easy to use, Klarity Bitmap analysis solution separates killer from nuisance defects and enhances root-cause analysis and yield learning on memory arrays.
Klarity Bitmap analysis solution with Klarity Defect, Klarity SSA, and Klarity ACE XP form a fab-wide yield acceleration and enhancement solution that automatically reduces defect inspection, classification and review data to relevant root-cause and automated yield-analysis information. Using yield analysis information, manufacturers can take corrective action sooner, resulting in faster yield enhancement and better time to market.