Bitmap Analysis for Yield Enhancement
Klarity Bitmap is an automated bitmap analysis and yield enhancement solution that collects multi-format bitmap analysis data from testers on the die test floor, classifies failure patterns and views the bitmap failures. Flexible and easy to use, Klarity Bitmap analysis solution separates yield-killer from nuisance defects and enhances root-cause analysis and yield learning on memory arrays.
Klarity Bitmap analysis solution with Klarity Defect, Klarity SSA, and Klarity ACE XP form a fab-wide yield enhancement and acceleration solution that automatically reduces defect inspection, classification and review data to relevant root-cause and automated yield-analysis information. Using yield analysis information, manufacturers can take corrective action sooner, resulting in faster yield enhancement and better time to market.