Chip Manufacturing

Defect Review

INS3000 DUV
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Automated Optical Defect Review and Classification System (up to 200mm)

altProduct Description

The INS3000 DUV automated optical defect review and classification system incorporates the advantages of a conventional optical microscope into a fully automated, production-ready tool. With wavelengths spanning visible, UV and DUV ranges, the INS3000 DUV enables the highest resolution available on an optical microscope: down to 80nm.
 

  • Ultimate optical resolution and throughput up to 2200 defects per hour
  • User-friendly operation with review interfaces for all major inspection systems
  • Optional UV, DUV and DIC module, retrofitable to existing INS systems
  • Optional automatic defect classification (ADC), image capture and archive modules
  • Automatic defect review capability for efficient image capture and offline review
  • Optional specialized automated inspection with SpotCheck
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