| Candela™ 6300Series |
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Topography Metrology and Defect Inspection Systems
Product Description The Candela 6300 series delivers best-in-class metrology and inspection capabilities for data storage substrates and finished media. The 6300 series leverages the industry's widest spatial bandwidth coverage (from 0.22 microns to 2,000 microns) and a noise floor below 0.5 angstroms to satisfy emerging requirements for comprehensive roughness and micro-waviness measurements. The 6300 series also harnesses patented multi-channel optics, combined with unique laser stability management technology, to deliver powerful measurement capabilities for edge roll-off and texture/polish uniformity, as well as scratch and particle inspection. The Candela 6300 is a manual system suited for laboratory and low volume production, and the Candela 6320 is an automated fully automated cassette-to-cassette system for production environments.Application Roughness and waviness analysis, defect inspection, scratch and ridge inspection, texture uniformity analysis, particle and stain inspection Contact our authorized sales representatives in the United States, Asia or Europe. For inquiries, please contact our This e-mail address is being protected from spambots. You need JavaScript enabled to view it , This e-mail address is being protected from spambots. You need JavaScript enabled to view it , or This e-mail address is being protected from spambots. You need JavaScript enabled to view it teams. |
