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KLA-Tencor Files Patent Infringement Suit
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SAN JOSE, Calif., Nov. 22, 2000-KLA Tencor Corp. (Nasdaq: KLAC) today announced it has filed patent infringement counterclaims against ADE Corporation in the United States District Court in Delaware. The counterclaims allege that ADE has infringed upon and continues to infringe upon three patents owned by KLA-Tencor. The patents are United States Patent Number 5,226,118, entitled "Data Analysis System and Method for Industrial Process Control System," United States Patent Number 5,883,710, entitled "Scanning System for Inspecting Anomalies on Surfaces," and United States Patent Number 6,081,325, entitled "Optical Scanning System for Surface Inspection."

The suit seeks damages for patent infringement as well as an injunction against any future infringement activity.

In addition, KLA-Tencor has asked the District Court for a declaration that United States Patent Number 6,118,525 is invalid and not infringed upon by KLA-Tencor. ADE had filed suit against KLA-Tencor in October of this year for allegedly infringing upon that patent.

About KLA-Tencor: KLA-Tencor is the world leader in yield management and process control solutions for semiconductor manufacturing and related industries. Headquartered in San Jose, Calif., the company has sales and service offices around the world. An S&P 500 company, KLA-Tencor is traded on the Nasdaq National Market under the symbol KLAC.

Contact:
Meggan Powers
Director Corporate Communications

 

 

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