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KLA-Tencor’s comprehensive portfolio of defect inspection, review, metrology, lithography modeling and in-situ process monitoring tools help chip manufacturing companies manage yield throughout the entire chip manufacturing and chip fabrication process – from research and development to final volume production. These products and solutions are designed to help fabs accelerate their development and production ramp cycles, to achieve higher and more stable semiconductor die yields, and to improve overall profitability in the chip manufacturing process.

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