featured products

• 8900 - High speed patterned-wafer defect inspection system suitable for detecting a wide variety of defects in the sub-micron to five-micron range, for image-sensor development and production as well as other applications
• Teron 600 - Reticle defect inspection platform with the sensitivity, flexibility and computational lithography power to enable development and manufacturing of reticles to support the wide variety of 2Xnm lithography schemes
• 2830 Series - Brightfield inspection platform with PowerBroadband™, a revolutionary high-brightness light source that enables more repeatable capture of difficult defects for accelerated ramp of leading-edge devices.
• Puma 9500 Series - Darkfield inspection platform with innovative opto-electronic technology, providing twice the resolution and twice the speed of previous-generation Puma tools, for high performance excursion monitoring.
  

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• A faster path from data to decisions
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• Reliable, high performance products
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